Low-Frequency Noise System (LFN-2000)
Low-Frequency Noise System (LFN-2000) is a highly cost-effective test system integrating low-frequency noise testing, ultra-low frequency noise testing, IV/IT curve scanning, and pulse voltage/current readback. Featuring a compact structure with a micro-optical platform, low-noise current amplifier, spectrum analyzer, and optical microscope, its core modules adopt imported brands to ensure measurement accuracy. With a probe station and shielding box connected, the system achieves a current noise floor of 2×10⁻²⁹ A²/Hz and an ultra-low frequency noise floor below 2×10⁻³¹ A²/Hz. It supports both two-terminal and three-terminal testing, meeting a wide range of measurement requirements.
System Photo
Software Interface
Key Specifications
| Item | Specification |
|---|---|
| Bias Voltage Range | ±10 V |
| Current Resolution | <500 fA or <1 fA |
| Frequency Range | 0.1 Hz – 100 kHz (or 0.01 Hz – 10 Hz) |
| Signal Output Range | 0.2 V, 1 V, 5 V, 10 V |
| Current Amplification | 10³ – 10¹¹ (or 10⁵ – 10¹³) |
| System Noise Floor | 10⁻²⁹ A²/Hz (Low Freq) / 10⁻³² A²/Hz (Ultra-Low Freq) |
| Data Averaging Modes | RMS, Vector, Peak |
| Integrated Modules | Micro-optical platform, low-noise amplifier, spectrum analyzer, optical microscope |
Technical Highlights
- Ultra-High Current Resolution: <10⁻¹⁵ A, with typical DC current measurement down to 1 fA.
- Ultra-Low Noise Floor: System noise floor of 10⁻²⁹ A²/Hz (low frequency) or 10⁻³² A²/Hz (ultra-low frequency).
- Broad Compatibility: Supports both two-terminal and three-terminal device testing.
- Integrated Micro Probe Station: Compact design with high cost-effectiveness.
- User-Friendly Software: Simple interface with one-click data and image storage.
- Dynamic Averaging: Visualization with up to 500 averages; supports RMS, Vector, and Peak modes.
Typical Applications
- 1/f Noise Testing and Analysis
- RTN (Random Telegraph Noise) Testing and Characterization
- DC Current Measurement: 1 fA level
- Quantum Efficiency and Responsivity
- Optical Response Time: 500 ns
- Reliability Non-Destructive Testing
- Integrated Micro Probe Station Measurements
- IV, IT Scanning and Pulse Testing
- Photocurrent and Dark Current Analysis
Measurement Examples
